Toshiba Releases Small Photorelay With High Speed Turn-On Time That Helps Shorten Test Time For Semiconductor Testers

Toshiba Releases Small Photorelay with High Speed Turn-On Time that Helps Shorten Test Time for Semiconductor Testers

TLP3476S is faster and more compact than Toshiba's current TLP3475S. It realizes high efficiency optical coupling by improving the optical output of infrared LEDs and optimizing the design of photo detector devices (photodiode arrays). This improves operating speed and pushes turn-on time to a maximum of 0.25ms -- 50% faster. It is also 20% slimmer, due to a smaller, low profile S-VSON4T package that is 1.4mm at maximum. This helps to reduce the size of equipment that requires multiple boards.

TLP3476S is suitable for the pin electronics of semiconductor testers, which use a large number of relays that require a shorter switching time.

     Applications

· Semiconductor testers (high-speed memory testers, high-speed logic testers, etc.)

· Probe cards

· Measurement equipment

    Features

· Small S-VSON4T packages: 1.45mm × 2.0mm (typ.), t=1.4mm (max)

· High-speed turn-on time: tON=0.25ms (max)

   Main Specifications

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